Silicon Pr0n

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Vendor	Model	Year	kV	Gun	Resolution (nm)	Features	Ask price	Manual	Notes
Phillips	FEG XL 40					EDAX	100,000
Phillips	501	1977	30		7				[1970s]
Phillips	501B	1979	30?		7?	EDS, WDS			[1970s]
Phillips	SEM 505	1980							“new doped-yttrium silicate scintillator for the detection of backscattered electrons in its 1980 model SEM 505; this new detector was 200 times more sensitive to backscattered electrons than previous scintillators” [1980s]
Phillips	SEM 515	1984							“improved on the 505 by adding computer-controlled automatic focussing and astigmation correction” [1980s]
Phillips	SEM 525 EB	1985							“created for functional testing of ICs” [1980s]
Phillips	SEM 525 IC	1985							“designed for the non-destructive testing of semiconductor wafers” [1980s]
Phillips	EM 300 accessory	1968							“attachment turned the TEM into an STEM” [1960s]
Phillips	PSEM 500	1972	50		10				“Philips' first SEM” [1970s]
Phillips	PSEM 500M	1973	50?		10?				“designed for larger samples, accommodating specimens with dimensions of 153 mm x 146 mm x 84 mm” [1970s]
Phillips	XL-30			W	3.5nm @ 30kV
RCA	EMU-3						275,000 for EMU-3/4 (way overpriced?)
RCA	EMU-4						275,000 for EMU-3/4 (way overpriced?)
SEC	SNE-1500M							Yes	Tabletop
SEC	SNE-3000M								Tabletop
SEC	SNE-3000MB								Tabletop
SEC	SNE-3200M								Tabletop
SEC	SNE-4500M								Tabletop
Seron	AIS2100C
Seron	AIS2200
Seron	AIS2300C
Tescan	VEGA3							Yes
Topcon	ABT-32				5
Topcon	ABT-60				4
Topcon	ABT-150
Topcon	SM-720				0.9
Zeiss	DSM 960						link
Zeiss	NEON 40 EsB			FE	2.5 nm @ 1 kV				“Canion FIB column”
Zeiss	SIGMA							Yes
Zeiss	Supra 55VP			FE	1.7 nm @ 1 kV 2 nm @ 30 kV (VP)