[[invasive]]
 
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invasive [2014/01/01 06:16] – mcmasterinvasive [2018/02/20 21:08] – [Backside analysis] mcmaster
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 ====== Backside analysis ====== ====== Backside analysis ======
  
-Fabs often thin wafers and perform backside analysis to get at the transistors without going through metal.  [Functional IC Analysis] doesn't look like they thinned and they got pretty decent results. +[[backside:start]]
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-Sample preparation example: http://jiam.utk.edu/new/PDF/Allied-Backside-Thinning.pdf +
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 ====== Rewiring ====== ====== Rewiring ======
  
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 The "professional" high end solution used for small processes.  Equipment is rather expensive. Some estimates seem to put them around an order of magnitude of 500,000 USD. The "professional" high end solution used for small processes.  Equipment is rather expensive. Some estimates seem to put them around an order of magnitude of 500,000 USD.
 +
 +FIB time can often be rented on an hourly basis from universities and research labs.
 +
 +azonenberg is beginning to experiment with FIB. [[azonenberg:fibnotes|Lab notes]]
 +
  
 ==== Scratching ==== ==== Scratching ====
 
invasive.txt · Last modified: 2018/02/25 09:10 by mcmaster
 
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