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| invasive [2014/01/01 06:15] – mcmaster | invasive [2018/02/25 09:10] (current) – mcmaster | ||
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| ====== Backside analysis ====== | ====== Backside analysis ====== | ||
| - | Fabs often thin wafers and perform backside analysis to get at the transistors without going through metal. | + | [[backside:start]] |
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| - | Sample preparation example: http:// | + | |
| ====== Rewiring ====== | ====== Rewiring ====== | ||
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| The " | The " | ||
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| + | FIB time can often be rented on an hourly basis from universities and research labs. | ||
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| + | azonenberg is beginning to experiment with FIB. [[azonenberg: | ||
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| ==== Scratching ==== | ==== Scratching ==== | ||
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| * Functional IC Analysis: http:// | * Functional IC Analysis: http:// | ||
| - | * Breaking and Entering through the Silicon | + | * Breaking and Entering through the Silicon: http:// |
| * Low-Cost Chip Microprobing | * Low-Cost Chip Microprobing | ||
| * http:// | * http:// | ||