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--- invasive [2014/02/28 09:45] – [FIB] azonenberg
+++ invasive [2025/08/04 21:23] (current) – external edit 127.0.0.1
@@ Line 3: / Line 3: @@
 ====== Backside analysis ======
-Fabs often thin wafers and perform backside analysis to get at the transistors without going through metal.  [Functional IC Analysis] doesn't look like they thinned and they got pretty decent results.
+[[backside:start]]
-Sample preparation example: http://jiam.utk.edu/new/PDF/Allied-Backside-Thinning.pdf
 ====== Rewiring ======