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 +Additional resources here: https://microwiki.org/wiki/index.php/Infrared
 +
 Backside analysis can include: Backside analysis can include:
   * Imaging transistor layout without delayering   * Imaging transistor layout without delayering
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   * https://www.iacr.org/archive/ches2012/74280037/74280037.pdf   * https://www.iacr.org/archive/ches2012/74280037/74280037.pdf
   * Great read on the subject   * Great read on the subject
 +
 +PICA
 +  * "Well known that well working gates emit light during switching"
 +  * "Emission is strongest when gate voltage is half of the drain voltage - the midpoint of the logic transition"
 +  * "PICA uses a strobed, intensified detector to gather spatial information and time information"
 +  * Specifically used a ring oscillator as an example of something it can image
  
  
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   * https://www.emse.fr/~dutertre/doc_recherche/C_2010_1_PASTIS2010.pdf   * https://www.emse.fr/~dutertre/doc_recherche/C_2010_1_PASTIS2010.pdf
   * https://twin.sci-hub.tw/6668/565d852b8454ae1cb3ef135fadb6defe/vasselle2017.pdf#view=FitH   * https://twin.sci-hub.tw/6668/565d852b8454ae1cb3ef135fadb6defe/vasselle2017.pdf#view=FitH
 +  * https://eprint.iacr.org/2018/717.pdf Xilinx key extraction
  
  
  
fi/backside.1555785895.txt.gz · Last modified: 2019/04/20 18:44 by mcmaster