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--- fi:backside [2018/05/24 17:39] – mcmaster
+++ fi:backside [2019/06/21 17:51] (current) – mcmaster
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+Additional resources here: https://microwiki.org/wiki/index.php/Infrared
 Backside analysis can include:
   * Imaging transistor layout without delayering
@@ Line 50: / Line 52: @@
   * https://www.iacr.org/archive/ches2012/74280037/74280037.pdf
   * Great read on the subject
+PICA
+  * "Well known that well working gates emit light during switching"
+  * "Emission is strongest when gate voltage is half of the drain voltage - the midpoint of the logic transition"
+  * "PICA uses a strobed, intensified detector to gather spatial information and time information"
+  * Specifically used a ring oscillator as an example of something it can image
@@ Line 246: / Line 254: @@
     * Think I have a small one
     * Alternatively cut down a wafer
+====== BJT emission ======
+https://lab.whitequark.org/notes/2014-06-14/transistor-as-a-light-source/
+https://twitter.com/whitequark/status/1119454148766961665
+https://twitter.com/frickler01/status/1119559064164417536
@@ Line 257: / Line 273: @@
     * Has a good overview of OBIC and other optical stuff
     * TODO: need a page on these other techniques
+  * https://www.emse.fr/~dutertre/doc_recherche/C_2010_1_PASTIS2010.pdf
+  * https://twin.sci-hub.tw/6668/565d852b8454ae1cb3ef135fadb6defe/vasselle2017.pdf#view=FitH
+  * https://eprint.iacr.org/2018/717.pdf Xilinx key extraction