Images taken by azonenberg on 2012-10-16 using JEOL JSM-840 SEM (20kV accelerating voltage, 39mm working distance, 6E-10A beam current).

Due to what appears to have been a mislabeled container this imaging session used a die that had been etched and slightly scratched rather than a virgin one.

Resolution was poor due to the long working distance being used. It was not possible to get any closer because the  [[pr0n>decap:purple_ceramic|purple ceramic]] specimen was being analyzed as well and bringing the SecurID die any closer would have caused the ceramic sample to smash into the objective. A future session will use an intact die and shorter working distance.


Full die overview

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Random region of gate array, 200x

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Closeup of gate array, 700x

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Die logo with revision codes, 300x

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Corner of the mask ROM, 1000x

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SRAM array, 1000x

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SRAM array, 2000x

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